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논문 기본 정보

자료유형
학술저널
저자정보
Haiting Ji (Chongqing Three Gorges University) Hui Li (Chongqing University) Yang Li (Chongqing University) Li Yang (Chongqing Three Gorges University) Guoping Lei (Chongqing Three Gorges University) Hongwei Xiao (Chongqing University) Jie Zhao (Chongqing University) Lefeng Shi (Research Institute of Chongqing Electric Power)
저널정보
전력전자학회 JOURNAL OF POWER ELECTRONICS JOURNAL OF POWER ELECTRONICS Vol.16 No.2
발행연도
2016.3
수록면
685 - 694 (10page)

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This paper presents a reliability assessment model for the power semiconductors used in wind turbine power converters. In this study, the thermal loadings at different timescales of wind speed are considered. First, in order to address the influence of long-term thermal cycling caused by variations in wind speed, the power converter operation state is partitioned into different phases in terms of average wind speed and wind turbulence. Therefore, the contributions can be considered separately. Then, in regards to the reliability assessment caused by short-term thermal cycling, the wind profile is converted to a wind speed distribution, and the contribution of different wind speeds to the final failure rate is accumulated. Finally, the reliability of an actual power converter semiconductor for a 2.5 MW wind turbine is assessed, and the failure rates induced by different timescale thermal behavior patterns are compared. The effects of various parameters such as cut-in, rated, cut-out wind speed on the failure rate of power devices are also analyzed based on the proposed model.

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Abstract
I. INTRODUCTION
II. THERMAL BEHAVIOR OF WTPCSS UNDER VARIABLE WIND SPEED
III. PROFILES OF LONG-TERM THERMAL LOADING AND RELIABILITY EVALUATION
IV. PROFILES OF THE SHORT-TERM THERMAL LOADING AND RELIABILITY EVALUATION
V. CASE STUDY
VI. CONCLUSION
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UCI(KEPA) : I410-ECN-0101-2016-560-002654051